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Test chips, test elements, test structures and monitor wafers for thin film characterization. Speciaized for ALD/CVD process development and monitoring support. Market leader in conformality test chips. PillarHall LHAR4 test chip products.

We are experts in thin film conformality characterization. Our main product – PillarHall test chip – is developed for advanced thin film process conformality characterization to accelerate applications of conformal 3D thin films.

Chipmetrics Oy is a part of the emerging Atomic Layer Deposition (ALD) industry and research community. Our headquarters are in Finland – in the country of the origin of ALD.